文件名称：用于时序电路中桥接故障的 IDDQ 测试的静态测试压缩
文件大小：335KB
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更新时间：2024-07-19 11:25:16
学术 论文
Static test compaction for IDDQ testing of bridging faults in sequential circuits Static Test Compaction for IDDQ Testing of Bridging Faults in Sequential Circuits Yoshinobu Higami Department of Computer Science, Ehime University, Matsuyama, Japan 790-8577 Kewal K. Saluja Department of Electrical and Computer Engineering, University of Wisconsin�Madison, Madison, Wisconsin 53706 Yuzo Takamatsu Department of Computer Science, Ehime University, Matsuyama, Japan 790-8577 Kozo Kinoshita G