文件名称:集成电路故障模拟器
文件大小:34KB
文件格式:Z
更新时间:2015-02-22 04:01:16
故障模拟 随机向量 故障覆盖率 FSIM
FSIM has the ability to generate pseudo-random patterns with various starting seeds and fault-simulate them. You can use this capability to test your own code on pseudo-random numbers, and use it as a comparison for more intelligent BIST approaches. FSIM能够根据不同种子,产生伪随机向量,并且进行故障模拟。