文件名称:EIA/JEDEC STANDARD jesd51-1
文件大小:564KB
文件格式:PDF
更新时间:2019-10-14 16:38:07
jesd51-1
Integrated Circuits Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
文件名称:EIA/JEDEC STANDARD jesd51-1
文件大小:564KB
文件格式:PDF
更新时间:2019-10-14 16:38:07
jesd51-1
Integrated Circuits Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)