文件名称:A comparison of the Kaufman brief intelligence test (K-BIT) with the Stanford-Binet, a two-subtest short form, and the Kaufman test of educational achievement (K-TEA) brief form
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更新时间:2024-07-19 14:03:50
学术 论文
A comparison of the Kaufman brief intelligence test (K-BIT) with the Stanford-Binet, a two-subtest short form, and the Kaufman test of educational achievement (K-TEA) brief form Psychology in rhe Schools Volume 30, Ocrober 1993 A COMPARISON OF THE KAUFMAN BRIEF INTELLIGENCE TEST (K-BIT) WITH THE STANFORD-BINET, A TWO-SUBTEST SHORT FORM, AND THE KAUFMAN TEST OF EDUCATIONAL ACHIEVEMENT (K-TEA) BRIEF FORM PETER N. PREWETT AND LUCY K . McCAFFERY University of West Florida The relations