IEEE 1149.1 JTAG AND BOUNDARY SCAN TUTORIAL

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文件名称：IEEE 1149.1 JTAG AND BOUNDARY SCAN TUTORIAL
文件大小：2.1MB
文件格式：PDF
更新时间：2018-05-27 16:55:51
IEEE 1149.1,JTAG In this tutorial, you will learn the basic elements of boundary-scan architecture — where it came from, whatproblems it solves, and its implications on the design of an integrated-circuit device. This tutorial also provides anoverview of the data standards applicable to the boundary-scan architecture and an overview of the software toolsavailable to perform boundary-scan-based tests.