Fringe Pattern Analysis for Optical Metrology

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文件名称：Fringe Pattern Analysis for Optical Metrology
文件大小：5.77MB
文件格式：PDF
更新时间：2021-09-26 03:44:28
图像处理 The main objective of this book is to present the basic theoretical principles behind modern fringe-pattern analysis as applied to optical metrology. In addition to this, for the experimentalist, we present in a ready-to-use form the most common algorithms for recovering the modulating phase from single or multiple fringe patterns. This book deals with phase demodulation of fringe patterns typically encountered in optical metrology techniques such as optical interferometry, shadow moire, fringe projection, photoelasticity, moir´e interferometry, moir´e deflectometry, holographic interferometry, shearing interferometry, digital holography, speckle interferometry, and corneal topography.