【文件属性】：
文件名称：Crystal Impact Match！2.1.3 试用延长
文件大小：20KB
文件格式：RAR
更新时间：2016-12-29 20:37:24
Crystal Impact Match！2.1.3 试用延长
Match!
Phase Identification from Powder Diffraction
Match! is an easy-to-use software for phase identification from powder diffraction data. It compares the diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Additional knowledge about the sample like known phases, elements or density can be applied easily.
In addition to this qualitative analysis, a quantitative analysis (using Rietveld refinement) can be performed as well. You can easily setup and run Rietveld refinements from within Match!, with the actual calculations being performed automatically, using the well-known program FullProf (by J. Rodriguez-Carvajal) in the background. Match! provides a gentle introduction into Rietveld refinement, from fully automatic operation to the "Expert" mode. The software runs natively on Windows, Mac OS X and Linux.
Screen shot of version 2. Click to enlarge.
As reference database, you can apply the included free-of-charge COD database and/or ICSD/Retrieve (if you have a valid licence), use any ICDD PDF product, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.
A list of Match!'s most prominent features can be found here.
Demonstration Version
If you are interested in evaluating MATCH!, you can download a time-limited demonstration version free-of-charge.
Brochure
A product brochure including feature list, system requirements and prices is available for download.
【文件预览】：
PatchMatch!.exe