文件名称：POWER-CONSTRAINED TESTING OF VLSI CIRCUITS
文件大小：14.6MB
文件格式：PDF
更新时间：2016-04-19 04:49:47
VLSI testing
Increased levels of chip integration combined with physical limitations of heat removal devices, cooling mechanisms and battery capacity, have established energy-efficiency as an important design objective in the implementation flow of modern electronic products. To meet these low energy objectives, new low power techniques, including circuits, architectures, methodologies, algorithms and computer-aided design tool flows, have emerged.