【文件属性】:
文件名称:Test Sequencing in Complex Manufacturing Systems
文件大小:526KB
文件格式:PDF
更新时间:2014-06-18 10:43:25
测试性,测试序列
Abstract—Testing complex manufacturing systems, such as an ASML lithographic machine, takes up to 45% of the total
development time of a system. The problem of which tests must
be executed in what sequence to ensure in the shortest possible
test time that the system works, which is the test-sequencing
problem, was already solved by Pattipati et al. for the diagnosis
of systems during operation. Test-sequencing problems during
the development and manufacturing phases of systems, however,
require a different approach than the test-sequencing problems
during operation. In this paper, the test problem description and
algorithms developed by Pattipati et al. are extended to solve
test-sequencing problems for the development and manufacturing
of manufacturing systems. For a case study in the manufacturing
process of an ASML lithographic machine, it is shown that solving
a test-sequencing problem with this method can reduce the test
time by 15% to 30% compared to experts that solve this problem
manually.