文件名称：Design For Reliability
文件大小：10.42MB
文件格式：RAR
更新时间：2013-12-13 07:21:11
Reliability
Authors: Dana Crowe & Alec Feinberg 1. Reliability Science 1.1 Introduction 1.2 Reliability Design: “A Stage Gate Approach” 1.3 Design for Reliability Tools 1.4 Reliability Verification 1.5 Analytical Physics 1.6 The Goal Is Customer Satisfaction 2. Understanding Customer Requirements 2.1 Introduction 2.2 Specified and Unspecified Requirements 2.3 Cost of Reliability 2.4 Benchmarking 2.5 Using Failure Modes and Effects Analysis to Meet Customer Requirements 3. Design Assessment Reliability Testing 3.1 Introduction 3.2 Four-Corner HALT Testing 3.3 Design Assessment Reliability Testing at the Hybrid and Component Level 3.4 Summary 4. Design Maturity Testing (DMT) 4.1 Introduction 4.2 Overview of DMT Planning 4.3 DMT Reliability Objectives 4.4 DMT Methods 4.5 Reliability and Sampling Distribution Models 4.6 Sample Size Planning 4.7 Automated Accelerated Test Planning 4.8 DMT Methodology and Guidelines References 5. Screening and Monotoring 5.1 Introduction 5.2 Achieving Reliability Growth in a Screening Program 5.3 Monitoring and Screening Tools 5.4 Highly Accelerated Stress Screening (HASS)Section II: Supporting Stage Gate Authors: Carl Bunis & Peter Ersland 6. Semiconductor Process Reliability 6.1 Introduction 6.2 Overview of Semiconductor Process Reliability Studies in the GaAs Industry 6.3 Wafer Level Reliability Tests 6.4 Summary References 7. Analytical Physics 7.1 Introduction 7.2 Physics of Failure 7.3 Analysis Flow 7.4 Failure Analysis Example 7.5 Analytical Techniques References Section III: Topics in Reliability Authors: Dana Crowe & Alec Feinberg 8. Reliability Statistics Simplified 8.1 Introduction 8.2 Definitions and Reliability Mathematics 8.3 Failure Rate Concepts 8.4 Reliability Models 8.5 Reliability Objectives and Confidence Testing 8.6 Parametric and Catastrophic Methods 8.7 Influence of Acceleration Factors on Test Planning References Appendix A – AT&T and Common Weibull Model Comparisons Appendix B – Helpful Microsoft® Excel Functions 9. Concepts in Accelerated Testing 9.1 Introduction 9.2 Common Sense Guidelines for Preventing Anomalous Accelerated Testing Failures 9.3 Time Acceleration Factor 9.4 Applications to Accelerated Testing 9.5 High-Temperature Operating Life Acceleration Model 9.6 Temperature-Humidity-Bias Acceleration Model 9.7 Temperature Cycle Acceleration Model 9.8 Vibration Acceleration Model 9.9 Electromigration Acceleration Model 9.10 Failure-Free Accelerated Test Planning 9.11 Step-Stress Testing 9.12 Describing Life Distributions as a Function of Stress 9.13 Summary References10. Accelerated Reliability Growth 10.1 Introduction 10.2 Estimating Benefits with Reliability Growth Fixes 10.3 Accelerated Reliability Growth Methodology 10.4 Applying Accelerated Reliability Growth Theory 10.5 Assessing Reliability Growth 10.6 Summary References Appendix – Accelerated Reliability Growth Stage Gate Model 11. Reliability Predictive Modeling 11.1 Introduction 11.2 System Reliability Modeling 11.3 Customer Expectations 11.4 Various Methods 11.5 Common Problems References Appendix A – Tabulated k of n System Effective Failure Rates Appendix B – Redundancy Equation with and without Repair Appendix C – Availability 12. Failure Modes and Effects Analysis 12.1 Failure Modes and Effects Analysis 12.2 FMEA Goal and Vision 12.3 FMEA Concepts 12.4 Types of FMEA Evaluations 12.5 Objectives 12.6 An FMEA Example 12.7 Implementation Methods Appendix A – Guide to Assigning FMEA Key Criteria Appendix B – FMEA Forms 13. Evaluating Product Risk 13.1 Introduction 13.2 Goals of a Risk Program 13.3 Managing Risks for Your Program 13.4 Four Steps to Risk Management 13.5 Guidelines for Risk Planning (Step 1) 13.6 Guidelines for Risk Assessment (Step 2) 13.7 Guidelines for Risk Analysis (Step 3) 13.8 Guidelines for Risk Handling (Step 4) 14. Thermodynamic Reliability Engineering 14.1 Thermodynamics and Reliability Engineering 14.2 The System and Its Environment 14.3 The Aging Process 14.4 Aging Due to Cyclic Force 14.5 Corrosion and Activation 14.6 Diffusion 14.7 Transistor Aging of Key Device Parameters 14.8 Understanding Logarithmic-in-Time Parametric Aging Associated with Activated Processes 14.9 Summary References
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[Book] Design For Reliability
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