文件名称：VPX标准规范之一/ VITA46.0 Draft Standard
文件大小：1.35MB
文件格式：PDF
更新时间：2013-03-15 10:23:28
VITA46.0 Draft Standard
Abstract This standard describes VITA 46.0 Advanced Module Format for VMEbus systems, an evolutionary step forward for the provision of high-speed interconnects in harsh-environment applications. Foreword VME has been the de-facto bus standard for Commercial off the Shelf ( COTS ) Circuit Card Assemblies since the 1980’s. VME boards have proven to be remarkably capable of evolving to support newer technologies with innovations such as VME Subsystem Bus, PCI Mezzanine Cards (PMC’s) and VME320. However, advances in technologies, appearing particularly in interconnects, have demonstrated the need for an advance in system development. This advance needs to accommodate high speed interconnect, particularly serial interconnects, and higher power delivery in concert with better heat removal. This draft standard addresses these needs in the context of IEEE 1101 form factor modules. Other specifications may address alternate outlines, such as VITA-48 (Draft). Because electronics miniaturization is driving the plug-in module I/O count, most system interconnects will need: Multi-gigabit differential technology Core computing cluster switched fabrics Serial RapidIO, PCI Express, Advanced Switching Interconnect Sufficient ports to enable distributed switching or centralized switching The plethora of high-speed interfaces available for tomorrow’s plug-in modules: Network interfaces (Fibre Channel, 10 GbE XAUI, Infiniband…,) Digital video (TMDS, PanelLink, OpenLDI…) Mass storage interface (Fibre Channel, Serial ATA…,) FPGA-based inter-board connections (e.g. Xilinx RocketIO) Custom sensor interfaces VITA 46 provides an evolutionary roadmap for VME users: To leverage the broad spectrum of high-speed interconnect technologies Backward compatibility with VME bus electrical, software and selected mechanicals Enables heterogeneous architectures which preserve existing investments in COTS-based systems Addresses both 3U and 6U form factors with commonality Harsh environment fit ‘designed-in’ up front in the standard Rugged air or conduction-cooled form factors High value placed on rear-panel I/O High-speed connector survivability/compliance