在进行参数试错时,通常将可能的参数由小到大排列一个个进行测试,这样的测试顺序很多时候不太合理,因此写了一个按二分法遍历顺序排列的算法,通常能更快的找到合适的参数。代码如下:
/*************************************************
Function: // BinarySort
Description: // sort array according to the traversal sequence of dichotomy
Input: // srcArray
Output: // dstArray
*************************************************/
void BinarySort(vector<int> srcArray, vector<int>& dstArray)
{
int begin = 0, end = srcArray.size()-1;
int mid, tempBegin, tempEnd;
vector<Point> intervalList;
intervalList.push_back(Point(begin,end));
while(intervalList.size()>0)
{
begin = intervalList.front().x;
end = intervalList.front().y;
mid = (begin + end)/2;
dstArray.push_back(srcArray[mid]);
if(begin <= mid-1)
{
tempBegin = begin;
tempEnd = mid - 1;
intervalList.push_back(Point(tempBegin,tempEnd));
}
if(mid+1 <= end)
{
tempBegin = mid+1;
tempEnd = end;
intervalList.push_back(Point(tempBegin,tempEnd));
}
intervalList.erase(intervalList.begin());
}
}
例如:
输入srcArray = [10](164,174,184,194,204,214,224,234,244,254)
输出dstArray = [10](204,174,234,164,184,214,244,194,224,254)